Tom Moore received his bachelors in Physics (1976), and his MS and PhD in Materials Science Engineering (1978, 1981) from the University of Virginia. Tom worked for 21 years in Texas Instrument’s Central Research Labs and in Assembly where he managed TI’s Silicon Technology Ramp and Advanced Characterization groups during TI’s conversion to copper and low-k dielectric processes. He left TI as a Distinguished Member of the Technical Staff to focus on Omniprobe in 2001. Tom was the General Chair for the International Test and Failure Analysis Symposium (ISTFA 2003), Chair of the Sematech Assembly Analysis Forum (1999-2000), a founder and first General Chair of the Advanced Materials and Failure Analysis Workshop (AMFA) and General Chair of the International Reliability Physics Symposium (IRPS 2010). He is Past President of the Electron Device Failure Analysis (EDFAS) Board of Directors, a former President of the IRPS Board of Directors and has published over 90 technical papers and chapters and has over 20 patents. Tom retired as the President and founder of Omniprobe Inc in 2011. He is now president of Waviks, Inc., in Dallas, TX. Waviks designs and builds advanced solutions for analysis and nanofabrication in the SEM/FIB/HIM.