Emission spectroscopy

Cathodoluminescence / Photoluminescence

Collect electron- or laser-stimulated emission and compare optical response with SEM/FIB images.

hBN cathodoluminescence spectrum acquired with Waviks hardware
Example hBN cathodoluminescence spectrum from Waviks CL/Raman source material.

Emission overview

Collect optical emission with electron microscopy context.

Cathodoluminescence collects light emitted under electron-beam stimulation. Photoluminescence collects light emitted after optical excitation. Waviks CL/PL systems connect those emission paths with SEM/FIB imaging where the microscope and detector path support the measurement.

Optical collection Detector paths Spectrometer path Alignment imaging Aether acquisition

Capabilities

Optical emission collection aligned with electron microscopy context.

Final configuration depends on microscope geometry, optical access, detectors, spectrometer configuration, sample type, and experiment goals.

Cathodoluminescence collection

Collect electron-beam-induced optical emission for spectral or image-correlated analysis.

Photoluminescence measurements

Support optically stimulated emission measurements where laser excitation and sample access are appropriate.

Spectrometer integration

Discuss detector and spectrometer paths around wavelength range, signal levels, and experiment goals.

Optical alignment and imaging

Use camera-first alignment and optical views to position collection paths and sample regions more repeatably.

Correlative electron/photon measurements

Connect optical emission signals with SEM/FIB images, maps, sample conditions, and material features.

Aether Software coordination

Coordinate cameras, spectrometers, illumination, acquisition views, and hardware profiles.

Applications

Emission measurements for materials where photons add context.

CL/PL workflows help connect optical response with structure, defects, interfaces, and local microscopy observations.

S

Semiconductors

Correlate optical emission with device structures, growth features, defects, and electron microscopy context.

D

Defect characterization

Investigate emission signatures tied to defect states, recombination pathways, or local material variation.

Q

Quantum materials

Support optical response studies where emission behavior benefits from spatially correlated microscopy data.

2D

2D materials

Explore local emission, layer-dependent response, strain effects, and correlative mapping workflows.

O

Optoelectronic materials

Connect optical performance indicators with morphology, interfaces, and electron/photon measurement context.

C

Correlative microscopy

Combine photon signals, spectra, maps, and SEM/FIB imaging into a more complete materials picture.

Cathodoluminescence Data

CL Emission Data
hBN cathodoluminescence spectrum
hBN cathodoluminescence spectrum acquired using Waviks hardware.

Planning a CL or PL experiment inside an electron microscope?

Tell us your microscope, sample, wavelength range, detector needs, and measurement goals. Waviks can help determine the right optical configuration.

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