In situ Raman spectroscopy
Collect vibrational spectra from regions of interest while preserving the SEM/FIB context needed for site-specific analysis.
SEM/FIB optical accessory
Vesta for SEM/FIB
Bring Raman spectroscopy, local laser heating, and photon collection to the region you examine in the SEM/FIB.
Accessory overview
Optical access for SEM and FIB measurements at the chamber.
Vesta for SEM/FIB adds chamber-based optical access so selected SEM/FIB systems can deliver light, collect optical signals, and align measurements near the electron-beam point of analysis.
Vesta optical paths support Raman, laser heating, CL/PL, and optical excitation where installed. A separate Waviks EBIC system can add contacted-sample current measurements using its own software.
SEM
FIB/SEM
Raman
Heating
Aether
Capabilities
Optical and analytical measurements built around the microscope.
Raman, laser heating, and CL/PL are modular optical paths that can be combined in one instrument when geometry supports them. EBIC is a separate electrical characterization technique. Optical alignment/imaging and Aether are standard across Vesta systems.
Laser heating
Add non-contact photothermal heating for thermal response, process studies, and experiment-specific sample stimulation.
Cathodoluminescence / photoluminescence
Support photon-emission measurements that connect local optical behavior with electron microscopy structure.
Optical alignment and imaging
Use camera-first views and optical path controls to align the sample, laser, collection path, and microscope coordinate frame.
Separate EBIC system
Add contacted-sample current measurements with Waviks EBIC hardware and its standalone software, alongside SEM/FIB imaging.
Aether Software
Control standard Vesta alignment/imaging functions plus installed laser, illumination, motion, spectroscopy, and hardware profiles from Aether Software.
Applications
SEM/FIB applications for materials, devices, and correlative microscopy.
Vesta is most valuable when the optical signal changes what researchers can understand inside the microscope chamber.
Nuclear materials
Study structural change, heating response, and local material behavior with correlative signals.
Semiconductors
Connect Raman, optical, electrical, and electron microscopy data for devices, defects, and process studies.
Beam-sensitive materials
Use photon-based measurements to add context where electron dose, heating, or local response must be managed carefully.
Catalysts
Investigate local structure and response in materials where surface, heat, and stimulation conditions matter.
Energy materials
Explore phase behavior, thermal response, and chemistry in battery, fuel, and advanced energy systems.
Correlative Raman/electron microscopy
Pair site-specific electron imaging with vibrational spectroscopy for richer materials interpretation.
Research-backed application examples
Published Laser-Assisted Experiments
Selected studies illustrate material-specific results, not guaranteed outcomes for every sample or configuration.
Laser-assisted EBID purification
Published experiments purified platinum-carbon deposits by laser-induced oxidation, using less than one second of cumulative laser exposure under the studied conditions.
Laser-assisted ion-damage mitigation
Synchronized pulsed laser heating reduced implantation and defect concentration by more than 90% in reported helium/neon-ion experiments on silicon.
Laser-induced graphene and nanofabrication
A 405 nm laser produced graphene features about 12 µm wide from polyimide inside an SEM, a reported reduction of more than 60% relative to earlier published feature sizes.
Planning an SEM/FIB optical experiment?
Tell us your microscope model, chamber geometry, available ports, and measurement goals. Waviks can review the right Vesta SEM/FIB path.