Application | Electrical Characterization
EBIC and Electrical Characterization
Measure electron-beam-induced current from contacted samples and compare electrical response with microscope image features.
SEM/FIB · Tabletop SEM · Selected S/TEM or Custom Systems
Signal
pA to nA EBIC response
Amplifier
Battery-powered TIA
Output
SEM image input route
Fit
Contact and feedthrough dependent
Why It Matters
See Electrical Microstructure, Not Just Surface Structure.
EBIC is useful when the sample can be contacted and the experiment needs spatial electrical response during electron-beam scanning. Waviks EBIC uses a dedicated signal path and standalone software; the sample contacts and microscope electrical access determine the installation.
What This Enables
Application Capabilities.
Battery-powered transimpedance amplifier route
Packaged-device and probing-station discussions
SEM/FIB image correlation through compatible signal routing
Waviks EBIC Software: a standalone suite, separate from Aether
Custom holder and feedthrough review where needed
Platform Fit
Microscope Options
Final fit depends on microscope geometry, optical access, sample environment, safety requirements, and the measurement goal.
SEM/FIB
Primary route
Tabletop SEM
Reviewed per holder/contact geometry
S/TEM
Configuration dependent
Custom Vacuum
Reviewed per chamber
Related Systems
Related Waviks Systems
Discuss Your Experiment
Tell Us What You Need.
Share your instrument, sample, and measurement goal so we can recommend a suitable system.
- Microscope platform and electrical feedthrough path
- Sample contacts, holder, probing station, or packaged-device needs
- Amplifier gain, bandwidth, coupling, and noise requirements
- Mapping, software, and export requirements
Planning an EBIC Experiment?
Tell Waviks the microscope, sample contacts, detector configuration, and electrical measurement goals. We can help determine the right EBIC route.